Optimization of ED-XRF Excitation Configuration Parameters to Determine Trace-Element Concentrations in Organic and Inorganic Sample Matrices
This paper, developed by the R&D team at SPECTRO Analytical Instruments,
explains the technology employed in a new class of energy-dispersive X-ray fluorescence (ED-XRF) spectrometers that employ a Bragg polarizer simultaneously with direct excitation and a novel, highly annealed, pyrolytic graphite (HAPG) crystal as a band-pass filter.
Using this optimum configuration, along with improvements in detector and digital signal processing techniques, the system allows for high precision analysis for minor and major elements across a wide wavelength range and lower detection capabilities for smaller groups of elements from potassium to manganese.
To demonstrate the practical benefits of this technology, the paper focuses on performance metrics for the determination of titanium in polymer samples, together with the multi-element analysis of high-purity graphite using the ashing sample preparation method. User benefits range from better precision to lower detection limits, and improved accuracy.