Moving your Lab to the Line with a Portable ED-XRF Spectrometer
For quality assurance and quality control, the ability to conduct elemental analysis of materials close to the production line can provide significant advantages not only for improving product quality and consistency but also for maximizing product throughput. This is true in many production applications in food, pharmaceutical, chemical, animal feed, metals production, and other industries.
In recent years, high power wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) and inductively coupled plasma optical emission spectrometry (ICP-OES) have been the main laboratory methods for elemental analysis for these types of applications. Both provide dependable accuracy and sufficient sensitivity but one drawback is that the analysis must be done in a lab. Once a sample is collected in the plant or process area it must be transported to the lab where it is often placed in a queue. A second drawback for ICP-OES is that it requires extensive sample preparation, which can add hours to analytical results
Today however, a new generation of high-resolution rapid screening technology using energy dispersive x-ray fluorescence (ED-XRF) spectroscopy makes at-line measurement a reality because it is now available in an instrument designed specifically to make lab-quality elemental analysis portable.
This presentation will discuss how this new portable ED-XRF instrument is being used as well as its accuracy, sensitivity, and repeatability. Examples of several specific applications and analytical results will also be presented. Additionally, suggestions on how to select a new ED-XRF instrument – what to look for and what to avoid will be discussed.
With a carefully selected system, at-line analysis using a new generation ED-XRF instrument can deliver the level of accuracy once found only in the lab and by doing so, can boost process throughput, reduce costs, and provide far more time-saving flexibility than ever before.