High-Precision Analysis Using Energy-Dispersive X-Ray Fluorescence Spectrometry
Highly precise analyses to measure major, minor, and trace elements — in matrices such as geological material, mining samples, cement, ceramics, refractories, or glass — were once reserved primarily for WD-XRF spectrometers.
Today, however, users in science, industry, and business have a viable alternative to these wavelength-dispersive X-ray fluorescence instruments. Once relegated mostly to simpler screening analyses, now energy-dispersive X-ray fluorescence (ED-XRF) spectrometers may achieve a level of precision comparable to WD-XRF.
This paper covers the use of the SPECTRO XEPOS ED-XRF spectrometer to analyze major and minor elements in samples of geological and mineral materials. It explores the advantages of fused bead sample preparation, and of technologies such as polarization and direct excitation, in reducing matrix effects and increasing sensitivity, accuracy, and stability.