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Mitigating Matrix Effects with Advanced Spectra-Handling Functionality When Using XRF for High-Accuracy Elemental Analysis

A great advantage of ED-XRF analysis for rapid screening analysis is its ability to measure samples directly, with a minimum of preparation. Realizing this benefit, however, requires eliminating potential errors that can result when atoms in the sample matrix influence the fluorescence of others and thus the intensities measured by the spectrometer are influenced. Such effects, which include absorption and enhancement, when taken collectively, are referred to generally as matrix effects. For quality control applications, when the sample matrix is known or can be matched, a variety of standards-based XRF calculation procedures are available to compensate for undesirable matrix effects.

However, creating the right basis for consistently high-accuracy results requires additional spectra handling functionality to determine the correct net intensities of the measured spectra. This paper explains why this additional functionality is a critical aspect of overcoming matrix effects and ensuring those consistently high-accuracy results.

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